Software
XPLORE v08.16 Setup Code: 17
Windows Installer KB893803 v2 x86
Microsoft dotNet Framwork v3.5
NI-DAQmx 8.9.5 - Drivers and Documentation
XPLORE_PATCH for XPLORE v08.16 Setup Code: 17
Videos
Working Principle of Scanning Acoustic Microscope (SAM) by KSI
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Operation of Scanning Acoustic Microscope (SAM) by KSI
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Documentation
Product Catalogue for Equipment
X-Ray Diffraction All in one; Small-, Wide-Angle and Grazing Incidence
SAXSpoint
: Small-, Wide-Angle, Grazing Incidence Compact Laboratory X-ray Scattering System for analysis of nanostructured materials.
SAXSpace
: Small- and Wide-Angle X-ray scattering (SWAXS) system for characterizing nanostructured materials and samples.
RheoOptics
: Application-specific Accessories for Structure Analysis. Apart from static nanostructure analysis, a further area of interest for material research and development.
Attachments for X-Ray Diffractometer of any Make or Model
Tensile Stage TS-600
Advanced sample stage for in-situ X-ray diffraction studies of stress/strain in materials.
High Temperature Stage HTK-1200N
High Temperature up to 1200˚C for in-situ X-ray diffraction for phase transformation studies in materials.
Nanoindenters by Nanomechanics Inc.
iNano™
nanoindenter is made easy and affordable by offering repeatability,accuracy and precision at a price that puts nanoindentation capability into reach for any lab’s budget.
iMicro™
nanoindenter is very useful tool where High Force, High Resolution, reproducibility of results with great precision and accuracy are required on affordable cost.
NanoFlip
is the most versatile mechanical properties testing instrument by offering researchers the option to use the tool in both in-situ environments and ambient settings depending on the demands of the experiment.
Application Notes
Scratch and Wear Testing v3
NanoBlitz Operating Instructions R1.0 (SKYD-1252-0 )
Mar Resistance on Polycarbonate
Complex Shear Modulus of Compliant Biomaterials
Dynamic Mechanical Analysis (DMA) of Polymers by Oscillatory Indentation
High-speed Mechanical Properties of CoorsTek TTZ Zirconia and Single-Crystal Alumina
Standardized Nanoindentation ISO 14577
Youngs Modulus of Glass Microspheres
Young’s Modulus and Hardness of Thin Low-κ Films Using Nanoindentation
Scanning Acoustic Microscope by Kraemer Sonic Industries (KSI)
Scanning Acoustic Microscope (S.A.M.)
is based on the same working principle as the well known medical ultrasonic examinations. Its applications are playing vital role in failure analysis and non-destructive evaluation.
